Topography and refractometry of nanostructures using spatial light interference microscopy
نویسندگان
چکیده
منابع مشابه
Topography and refractometry of nanostructures using spatial light interference microscopy.
Spatial light interference microscopy (SLIM) is a novel method developed in our laboratory that provides quantitative phase images of transparent structures with a 0.3 nm spatial and 0.03 nm temporal accuracy owing to the white light illumination and its common path interferometric geometry. We exploit these features and demonstrate SLIM's ability to perform topography at a single atomic layer ...
متن کاملTopography and refractometry of nanostructures using spatial light interference microscopy (SLIM)
Spatial Light Interference Microscopy (SLIM) is a novel method developed in our laboratory that provides quantitative phase images of transparent structures with 0.3 nm spatial and 0.03 nm temporal accuracy owing to the white light illumination and its common path interferometric geometry. We exploit these features and demonstrate SLIM's ability to perform topography at a single atomic layer in...
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We present Instantaneous Spatial Light Interference Microscopy (iSLIM) as a new quantitative phase method that combines the benefits of white light illumination in Zernike's phase contrast microscopy and phase stability associated diffraction phase microscopy. iSLIM is implemented as an add-on module to a commercial phase contrast microscope, and enables new features to quantitative phase imagi...
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We report a scheme to achieve resolution beyond the diffraction limit in spatial light interference microscopy (SLIM). By adding a grating to the optical path, the structured illumination technique can be used to improve the resolution by a factor of 2. We show that a direct application of the structured illumination technique, however, has proved to be unsuccessful. Through two crucial modific...
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ژورنال
عنوان ژورنال: Optics Letters
سال: 2010
ISSN: 0146-9592,1539-4794
DOI: 10.1364/ol.35.000208